Layer-by-layer inspection of ionic polymer-quantum dots interactions by camera-less terahertz image
· 29.01.2021 · 22:23:13 ··· ··· Friday ·· 5 (5)
Anis Rahman Anis Rahman, PhD
Applied Research & Photonics, Inc.
470 Friendship Road, Suite 10, Harrisburg, PA 17111, USA
Email: a.rahman@arphotonics.net
Web: http://arphotonics.net
http://terahertz.arphotonics.net
http://terahertz.us
Tel: +1-717-623-8201
Abstract
Probing deeper via non-destructive means is important for proper characterization of semiconductors and nanomaterials. It is also important for post processed inspection, interface properties, and failure analysis. However, the current state of the art can only see one surface at a time. While X-ray can penetrate into many materials, it causes degradations because of its strong ionization nature. Terahertz radiation (T-ray) is non-ionizing and non-perturbing, as such adds a new frontier for very high sensitivity spectroscopy and camera-less, lattice resolution imaging, overcoming the Abbe’s diffraction limit. The Dendrimer Dipole Excitation (DDE) based terahertz camera-less imaging offers the advent of very high sensitivity analysis of semiconductors and nanomaterials including the zero-dimensional to three-dimensional materials. Since the T-ray penetrates almost all materials, this route also offers the advent of probing the inner structures of materials including the volume imaging and layer-by-layer analysis. This paper focuses on the applications of this new and emerging technology for analyzing practical systems for the layer-by-layer inspection and three-dimensional interactions among and between the materials on nano to sub-Angstrom scale.
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